| MOS功率晶體管門控的靜電測(cè)試 | |
| 所屬分類：解決方案 | |
| 上傳者：news | |
| 文檔大小：104 K | |
| 標(biāo)簽： ADI TI FPGA | |
| 所需積分：0分積分不夠怎么辦？ | |
| 文檔介紹：MOS功率晶體管門控的靜電測(cè)試:Electrostatic Discharge (ESD) Objective: Verification that the product is robust against electrostatic discharge, which can be excepted during handling of the devices. The ESD robustness is equivalent to the maximum voltage this product can withstand. Testing is done according to the Human Body Model as described below. | |
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