中圖分類號(hào)： TN402
文獻(xiàn)標(biāo)識(shí)碼： A
DOI：10.16157/j.issn.0258-7998.201230
中文引用格式： 翟鵬飛，周雄，李強(qiáng). 用于SoC電源噪聲測(cè)量的低溫漂VCO[J].電子技術(shù)應(yīng)用，2021，47(6)：46-50，61.
英文引用格式： Zhai Pengfei，Zhou Xiong，Li Qiang. A low temperature drift VCO for SoC power supply noise measurement[J]. Application of Electronic Technique，2021，47(6)：46-50，61.

A low temperature drift VCO for SoC power supply noise measurement

Abstract： This paper presents a two-stage temperature compensated ring VCO-based quantizer for on-chip power supply noise measurement. To achieve a lower temperature coefficient, the coarse and fine temperature compensated stages are both exploited. In the coarse stage, a proportional-to-absolute-temperature(PTAT) current injects in the current starved ring VCO to compensate the large part of the temperature coefficient of the VCO, and as the fine compensated stage, a replica VCO is employed to sense temperature variation and further adjust the oscillation frequency of the VCO adaptively. The ring VCO-based quantizer is operated at a 1.1 V supply. The simulation results show the output frequency of the VCO is 4.3 GHz, and it achieves a low temperature sensitivity of 15.5 ppm/℃ over the range from -40 ℃ to 125 ℃ with the two-stage temperature compensation.

Key words : temperature compensation；ring oscillator；VCO-based quantizer；power supply noise measurement